GENEVA, Nov. 4 -- ONX, INC. (4813 N. Interstate 35, Building 1Georgetown, Texas 78633) filed a patent application (PCT/US2025/021004) for "METHOD AND ARRANGEMENT FOR COUPLING HORIZONTAL AND VERTICAL P... Read More
GENEVA, Nov. 4 -- SK HYNIX NAND PRODUCT SOLUTIONS CORP. (10951 White Rock RdRancho Cordova, CA 95670) filed a patent application (PCT/US2025/024709) for "SYSTEMS, METHODS, AND MEDIA FOR PROVIDING APPE... Read More
GENEVA, Nov. 4 -- GOOGLE LLC (1600 Amphitheatre ParkwayMountain View, California 94043) filed a patent application (PCT/US2025/022987) for "ِA QUERY RESPONSE INTERFACE WITH SERVER SIDE GENERATIV... Read More
GENEVA, Nov. 4 -- ORO AGRI INC. (2788 S. Maple AvenueFresno, California 93725) filed a patent application (PCT/US2025/021331) for "AGRICULTURAL COMPOSITION" on Mar 25, 2025. With publication no. WO/20... Read More
GENEVA, Nov. 4 -- DOW SILICONES CORPORATION (2211 H.H. Dow WayMidland, Michigan 48674), DOW GLOBAL TECHNOLOGIES LLC (2211 H.H. Dow WayMidland, Michigan 48674) filed a patent application (PCT/US2025/02... Read More
GENEVA, Nov. 4 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2025/021479) for "ISOLATION MODULE FOR BACKSIDE POWER DELIVERY" on Mar 26,... Read More
GENEVA, Nov. 4 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2025/024508) for "SELF-LIMITED ETCHING OF LOW-K MATERIALS" on Apr 14, 2025... Read More
GENEVA, Nov. 4 -- OUTDOOR WIRELESS NETWORKS LLC (2601 Telecom ParkwayRichardson, Texas 28610) filed a patent application (PCT/US2025/021473) for "ANTENNA MOUNTS AND ANTENNA MOUNTING KITS FOR POLE TOP ... Read More
GENEVA, Nov. 4 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2025/022142) for "SEQUENTIAL SELF-ALIGNING METHOD IN COMPLEMENTARY FIELD E... Read More
GENEVA, Nov. 4 -- KLA CORPORATION (One Technology DriveMilpitas, California 95035) filed a patent application (PCT/US2025/022844) for "SYSTEM AND METHOD FOR DETERMINING OVERLAY MEASUREMENT OF A SCANNI... Read More